Research Status of Metallized Film Capacitor Failures

doi:10.3969/j.issn.1008-0198.2025.06.012

Abstract

Abstract: With the expansion of application scenarios and the intensification of working environments, the failure issues of metallized film capacitors have become increasingly prominent, emerging as a critical constraint on the reliability of power systems. Starting from the two dimensions of film material failure and metallized film capacitor device failure, this paper systematically analyzes the failure mechanisms of metallized film capacitors, with a focus on elaborating the intrinsic connections and fundamental differences between microscopic film failure and macroscopic device failure, and summarizes the evolution patterns of metallized film capacitor performance under multi-field effects including electric field, temperature, and mechanical stress. Finally, failure protection strategies and technical improvements are proposed to provide a theoretical foundation for the reliability design and lifetime prediction of metallized film capacitors.

Key words: metallized film capacitors, self-healing, failure mechanisms, failure protection

CLC Number:

TM532

SUN Xinbo, ZOU Baisu, WANG Ming, CHEN Risheng, FENG Mengjia. Research Status of Metallized Film Capacitor Failures[J]. Hunan Electric Power, 2025, 45(6): 91-96.

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