湖南电力 ›› 2022, Vol. 42 ›› Issue (5): 1-7.doi: 10.3969/j.issn.1008-0198.2022.05.001

• 特别推荐 •    下一篇

基于Simulink与COMSOL联合仿真的MOS场效晶体管瞬态特性分析

高兵1, 王帅1, 钟永恒2, 孙雅森1, 张尚琛1, 周婕1   

  1. 1.湖南大学电气与信息工程学院,湖南 长沙 410012;
    2.国网湖南省电力有限公司电力科学研究院,湖南 长沙 410007
  • 收稿日期:2022-08-01 出版日期:2022-10-25 发布日期:2022-11-16
  • 作者简介:高兵(1987),男,副教授,通信作者,从事输变电设备多物理场建模、数字孪生技术、电声换能装备等研究。
    王帅(1999),男,硕士研究生,从事输变电设备数字孪生技术与无损检测技术研究。
  • 基金资助:
    国家自然科学基金青年基金(52007013)

Transient Characteristic of MOESFET Based on Cosimulation Simulink with COMSOL

GAO Bing1, WANG Shuai1, ZHONG Yongheng2, SUN Yasen1, ZHANG Shangchen1, ZHOU Jie1   

  1. 1. College of Electrical and Information Engineering, Hunan University, Changsha 410012, China;
    2. State Grid Hunan Electric Power Company Limited Research Institute, Changsha 410007, China
  • Received:2022-08-01 Online:2022-10-25 Published:2022-11-16

摘要: 功率器件是电力电子系统中的薄弱环节之一,其失效具有明显的多尺度特征,构建能够考虑功率器件多尺度特征的瞬态模型对器件状态监测与老化评估具有重要意义。以MOS场效晶体管(metal-oxide-semiconductor field effect transistor,MOSFET)为研究对象,构建了功率器件Simulink与COMSOL场路联合仿真模型,选取以导通电流和导通压降为模型交互信息,实现器件开关信息和宏观物理信息交互作用的器件瞬态特性分析。在此基础上,分析功率器件芯片处均温(壳温)、芯片上表面均温(结温)、导通压降、芯片电阻、焊料层最大位移。结果表明,所构建模型能够有效反映器件开关特性和宏观场间的交互,为器件数字孪生模型奠定基础。

关键词: MOSFET, 开关电路, 有限元模型, 联合仿真, 瞬态分析

Abstract: Power devices are one of the weak links in power electronic systems, and their failure has obvious multi-scale characteristics. It is of great significance to build a transient model that can consider the multi-scale characteristics of power devices for device condition monitoring and aging evaluation. Therefore, this paper takes MOSFET as the research object, constructs the field circuit joint simulation model of power device Simulink and COMSOL, and realizes the transient characteristic analysis of devices considering the interaction of device switching information and macro physical information by selecting the on current and on voltage drop as the model interaction information. The average temperature at the chip (shell temperature), the average temperature on the surface of the chip (junction temperature), the conduction voltage drop, the chip resistance and the maximum displacement of the solder layer are analyzed. The results show that the model can effectively consider the switching characteristics of devices and the interaction between macro fields, and lay the foundation for the digital twin model of devices.

Key words: MOSFET, switch circuit, finite element model, cosimulation, transient analysis

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